Tests of Gaussian statistical properties of 1/f noise
- 1 October 1983
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 54 (10) , 5844-5847
- https://doi.org/10.1063/1.331809
Abstract
Two statistical tests of 1/f noise—histograms of noise power in time-frequency windows and covariance matrices of noise power in separate octave bands—were used to determine deviations from Gaussian statistics. In silicon, bismuth, and some carbon granule resistors no non-Gaussian effects were found. One carbon resistor showed clear non-Gaussian behavior. The significance of the results for models of the origins of 1/f noise is discussed.This publication has 16 references indexed in Scilit:
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