A Novel Technique for Measuring the Frequency Deviation of Semiconductor Lasers Under Direct Modulation

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Abstract
A novel technique is proposed for measuring the frequency deviation of semiconductor lasers under direct modulation using a Michelson interferometer. This technique is applicable to a wide range of modulation frequency and does not require high-speed photo-detectors. The accuracy of the measurement is not reduced by the spectral line-width of lasers, the misalignment of the optical axes, or the depth of intensity modulation.