X-ray photoelectron diffraction and spectroscopy of sputter-deposited or evaporated coinage metals on Si(100)

This publication has 28 references indexed in Scilit:

• Amorphization of c-Si by the sputter deposition of Au studied by x-ray photoelectron diffraction
  Journal of Vacuum Science & Technology A, 1992
• Surface dimer formation on GaAs(001)-c(2 × 8)(2 × 4) studied by X-ray photoelectron diffraction
  Surface Science, 1991
• Angle-resolved x-ray-photoemission study of the surface disordering of Pb(100)
  Physical Review B, 1991
• A scanning tunnelling and transmission electron microscopy comparison of the surface structure of evaporated and ion-assisted gold films
  Applied Surface Science, 1991
• X-Ray photoelectron and auger electroo forward scattering: A new tool for surface crystallography
  Critical Reviews in Solid State and Materials Sciences, 1990
• X-ray photoelectron spectroscopy studies of aging effects on the surface of Au – a-Si:H – Sb-Cr Schottky diodes
  Canadian Journal of Physics, 1989
• Role of incident kinetic energy of adatoms in thin film growth
  Surface Science, 1987
• Estimation of Low-Energy Ion Bombardment Damage on GaAs(001) Surface by X-Ray Photoelectron Diffraction
  Japanese Journal of Applied Physics, 1986
• Formation of noble-metal-Si(100) interfaces
  Surface Science, 1986
• Epitaxial crystal growth by sputter deposition: Applications to semiconductors. Part 2
  Critical Reviews in Solid State and Materials Sciences, 1983