Detection of Boron Segregation to Grain Boundaries in Silicon Carbide by Spatially Resolved Electron Energy‐Loss Spectroscopy
- 1 February 1999
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 82 (2) , 469-472
- https://doi.org/10.1111/j.1551-2916.1999.tb20089.x
Abstract
No abstract availableKeywords
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