Applied stresses, cyclotron masses and charge-density-waves in silicon inversion layers
- 31 May 1977
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 22 (7) , 447-450
- https://doi.org/10.1016/0038-1098(77)90122-3
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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