Comparison de trois méthodes d'estimation par microscopie des aires de surface projetée de systèmes dispersés
- 31 October 1975
- journal article
- Published by Elsevier in Powder Technology
- Vol. 12 (2) , 103-110
- https://doi.org/10.1016/0032-5910(75)80002-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Operator error in optical microscopyPowder Technology, 1972
- A simulated array of particle profiles for use in microscope methods of particle size analysisPowder Technology, 1971
- Factors in the design of a microscope eyepiece graticule for routine dust countsBritish Journal of Applied Physics, 1954