Fine tuning of track impact parameter resolution of the DELPHI detector
- 1 March 1996
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 372 (1-2) , 181-187
- https://doi.org/10.1016/0168-9002(95)01287-7
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The DELPHI silicon strip microvertex detector with double sided readoutNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1996
- Measurement of the forward-backward asymmetry ofe + e −→Z→ $$b\bar b$$ using prompt leptons and a lifetime tagThe European Physical Journal C, 1995
- Measurement of $$\frac{{\Gamma _{b\bar b} }}{{\Gamma _{had} }}$$ using impact parameter measurements and lepton identificationThe European Physical Journal C, 1995
- A precise measurement of ΓZ→bb/ΓZ→hadronsPhysics Letters B, 1993
- The DELPHI Microvertex detectorNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1993