Antifuse structure comparison for field programmable gate arrays

1 January 1992

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iedm.1992.307435

Abstract

Antifuse structure as a programming element has become increasingly popular in field programmable gate array devices. In this paper we discuss the characteristics of various antifuse structures. Tradeoffs between performance and reliability are also discussed.

Keywords

CIRCUIT RELIABILITY
ELECTRIC BREAKDOWN
FUSES
LEAKAGE CURRENTS
LOGIC ARRAYS
STABILITY

This publication has 1 reference indexed in Scilit:

Scaled dielectric antifuse structure for field-programmable gate array applications
IEEE Electron Device Letters, 1991