Scanning electron microscope identification of weak links in superconducting thin films
- 26 September 1988
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 53 (13) , 1210-1212
- https://doi.org/10.1063/1.100667
Abstract
We have used a pulsed electron beam in a scanning electron microscope to produce highly localized (∼1 μm) changes in the electrical properties of a heterogeneous thin film of YBa2Cu3O7−δ . The predominant effect of the beam is to locally heat the film, producing a measurable shift in the current-voltage characteristic. In particular, we have precisely located the part of the film responsible for a sharp feature in the current-voltage characteristic corresponding to a single Josephson junction. The technique should also be useful more generally in identifying specific weak links in superconducting thin films.Keywords
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