Differential reflectometry of sputtered silver-aluminum films between 1.6 and 6.2 eV
- 1 September 1981
- journal article
- Published by Elsevier in Optics Communications
- Vol. 39 (1-2) , 55-58
- https://doi.org/10.1016/0030-4018(81)90454-5
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Optical absorption of Ni-based alloysPhysical Review B, 1980
- Interpretation of Compositional Modulation Spectra to Determine Some Optical Properties of AlloysPhysica Status Solidi (b), 1978
- Optical properties and electronic structure of dilute Cu-Au, Cu-Zn, Cu-Al, Cu-Ga, Cu-Si, Cu-Ge, Cu-Sn, and Cu-As alloysPhysical Review B, 1977
- Modulated Reflectivity Measurements on-phase Cu-Zn, Cu-Al, Cu-Ga, and Cu-Ge AlloysPhysical Review B, 1973
- Optical studies of dilute copper-gallium and copper-germanium alloysJournal of Physics F: Metal Physics, 1973
- Compositional modulation of CuZn, CuAl and CuNi alloysSurface Science, 1973
- Differential studies of dilute metal alloys — Screening charges and interactions between impuritiesSurface Science, 1973
- A ``Differential Reflectometer'' for Measurements of Small Differences in ReflectivityReview of Scientific Instruments, 1973
- Electronic Structure of Noble-Metal-Noble-Metal AlloysPhysical Review B, 1972
- Optical Reflectivity Measurements on Alloys by Compositional ModulationPhysical Review Letters, 1970