Rough surface wavelength measurement through self mixing of Doppler microwave backscatter
- 1 November 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Antennas and Propagation
- Vol. 27 (6) , 730-737
- https://doi.org/10.1109/tap.1979.1142179
Abstract
No abstract availableKeywords
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