Modified sample holder for low-temperature deep-level transient spectroscopy, current-voltage and capacitance-voltage measurements
- 1 March 1992
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 63 (3) , 2101-2102
- https://doi.org/10.1063/1.1143175
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- The influence of thermal gradients on the characterization of Schottky-barrier diodesIEEE Transactions on Electron Devices, 1990
- Novel variable-temperature chuck for use in the detection of deep levels in processed semiconductor wafersReview of Scientific Instruments, 1979