Transverse electron focussing and surface roughness
- 30 November 1983
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 48 (8) , 643-645
- https://doi.org/10.1016/0038-1098(83)90042-x
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Explanation of the apparentdependence of the surface-induced electrical resistivity in pure metals from measurements on high-purity Au foilsPhysical Review B, 1983
- Electrical conduction in superimposed metal filmsSurface Science, 1982
- The resistivity of thin wiresJournal of Physics F: Metal Physics, 1982
- Electrical conduction in metal foilsJournal of Physics F: Metal Physics, 1980
- Transverse electron focusing and specular reflection in silverJournal of Physics F: Metal Physics, 1979
- Statistical Model for the Size Effect in Electrical ConductionJournal of Applied Physics, 1967
- The conductivity of thin metallic films according to the electron theory of metalsMathematical Proceedings of the Cambridge Philosophical Society, 1938