Quantitative modelling in scanning probe microscopy
- 31 October 2001
- journal article
- Published by Elsevier in Current Opinion in Solid State and Materials Science
- Vol. 5 (5) , 427-434
- https://doi.org/10.1016/s1359-0286(01)00025-0
Abstract
No abstract availableKeywords
This publication has 51 references indexed in Scilit:
- Tunneling spectroscopy of the Si(111)2 × 1 surfacePublished by Elsevier ,2002
- Ab initio simulations and STM-images for Co/Pt(110) surfacesSurface Science, 2001
- Theoretical aspects of tunneling-current-induced bond excitation and breaking at surfacesFaraday Discussions, 2000
- Island Nucleation in Thin-Film Epitaxy: A First-Principles InvestigationPhysical Review Letters, 2000
- Low Temperature Scanning Force Microscopy of theSurfacePhysical Review Letters, 2000
- Scanning tunneling microscopy of binary alloys: first principles calculation of the current for PtX (100) surfaces.Surface Science, 2000
- Efficient method for the simulation of STM images. I. Generalized Green-function formalismPhysical Review B, 1997
- Influence of the tip-induced electric field on the STM contrast of chemisorbedon the Si(001) surfacePhysical Review B, 1997
- Apparent Barrier Height in Scanning Tunneling Microscopy RevisitedPhysical Review Letters, 1996
- Theory of the scanning tunneling microscopePhysical Review B, 1985