Determination of the Total Texture Function from Individual Orientation Measurements by Electron Backscattering Pattern
- 1 October 1993
- journal article
- Published by Springer Nature in Metallurgical Transactions A
- Vol. 24 (10) , 2299-2311
- https://doi.org/10.1007/bf02648603
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- Microtexture Characterization by EBSP in Iron and Titanium AlloysTexture, Stress, and Microstructure, 1993
- Caractérisation de la texture de recristallisation primaire et de la spécialité des joints de grains de tôles de Fe-3%Si par diffraction des electrons rétrodiffusésJournal of Applied Crystallography, 1992
- Characterization of Recrystallization Textures in Fe‐3% Si Sheets by EBSP: Comparison With X RayDiffractionTexture, Stress, and Microstructure, 1991
- Determination of Complete O.D.F.s Under Assumption of a MinimalValueTexture, Stress, and Microstructure, 1991
- Determination of the ODF of Hexagonal Symmetry Materials According to the Maximum Entropy MethodTexture, Stress, and Microstructure, 1988
- A Positivity Method for the Determination of Complete Orientation Distribution FunctionsTexture, Stress, and Microstructure, 1988
- Texture Analysis by Iteration. II. Special Cases of the General SolutionPhysica Status Solidi (b), 1983
- Texture analysis by iteration. I. General solution of the fundamental problemPhysica Status Solidi (b), 1983
- Importance of odd coefficients in texture calculations for trigonal–triclinic symmetriesPhysica Status Solidi (a), 1981
- Inversion of Pole Figures for Materials Having Cubic Crystal SymmetryJournal of Applied Physics, 1966