Remote surface inspection system
- 31 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
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- Machine vision algorithms for automated inspection thin-film disk headsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1988
- The structure of imagesBiological Cybernetics, 1984