Neutron single event effect test results for various SRAM memories

• 23 November 2002
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 61-66
• https://doi.org/10.1109/redw.1997.629799

Abstract

Keywords

• NEUTRONS
• POWER DISSIPATION
• THIN FILM TRANSISTORS
• WRITING
• TESTING
• DOSIMETRY