Nonlinear dynamical properties of an oscillating tip–cantilever system in the tapping mode
- 22 July 1999
- journal article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 111 (4) , 1615-1627
- https://doi.org/10.1063/1.479422
Abstract
The dynamical properties of an oscillating tip-cantilever system are now widely used in the field of scanning force microscopy. The aim of the present work is to get analytical expressions describing the nonlinear dynamical properties of the oscillator in noncontact and intermittent contact situations in the tapping mode. Three situations are investigated: the pure attractive interaction, the pure repulsive interaction, and a mixing of the two. The analytical solutions obtained allow general trends to be extracted: the noncontact and the intermittent contact show a very discriminate variation of the phase. Therefore the measurement of the phase becomes a simple way to identify whether or not the tip touches the surface during the oscillating period. It is also found that the key parameter governing the structure of the dynamical properties is the product of the quality factor by a reduced stiffness. In the attractive regime, the reduced stiffness is the ratio of an attractive effective stiffness and the cantilever one. In the repulsive regime, the reduced stiffness is the ratio between the contact stiffness and the cantilever one. The quality factor plays an important role. For large values of the quality factor; it is predicted that a pure topography can be obtained whatever the value of the contact stiffness. For a smaller quality factor, the oscillator becomes more sensitive to change of the local mechanical properties. As a direct consequence, varying the quality factor, for example with a vacuum chamber, would be a very interesting way to investigate soft materials either to access topographic information or nanomechanical propertiesKeywords
All Related Versions
This publication has 26 references indexed in Scilit:
- Growth kinetics of a nanoprotuberance under the action of an oscillating nanotipPhysical Review B, 1999
- Analytical descriptions of the tapping-mode atomic force microscopy responseApplied Physics Letters, 1998
- Determination of complex modulus by atomic force microscopyJournal of Applied Physics, 1997
- Sol–Gel Derived Pb(Zr,Ti)O3 Thin Films: Effects of PbTiO3 InterlayerJapanese Journal of Applied Physics, 1996
- Generic Behavior of Grazing Impact OscillatorsPhysical Review Letters, 1996
- Surface Reconstruction of the Lamellar Morphology in a Symmetric Poly(styrene-block-butadiene-block-methyl methacrylate) Triblock Copolymer: A Tapping Mode Scanning Force Microscope StudyMacromolecules, 1996
- Microdomain Morphology Analysis of Block Copolymers by Atomic Force Microscopy with Phase Detection ImagingLangmuir, 1996
- Deformation, Contact Time, and Phase Contrast in Tapping Mode Scanning Force MicroscopyLangmuir, 1996
- Study of Grafted Silane Molecules on Silica Surface with an Atomic Force MicroscopeLangmuir, 1996
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995