High resolution X-ray diffraction studies on hexaphenyl thin films
- 1 July 1998
- journal article
- Published by Elsevier in Surface Science
- Vol. 409 (2) , 302-306
- https://doi.org/10.1016/s0039-6028(98)00230-1
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Orientation-controlled organic electroluminescence of p-sexiphenyl filmsApplied Physics Letters, 1997
- Photoexcitations inpara-hexaphenylPhysical Review B, 1997
- Growth and preferred crystallographic orientation of hexaphenyl thin filmsThin Solid Films, 1997
- One-Dimensional Growth of Phenylene Oligomer Single Crystals on Friction-Transferred Poly(p-phenylene) FilmJapanese Journal of Applied Physics, 1997
- Red–green–blue light emission from a thin film electroluminescence device based on parahexaphenylAdvanced Materials, 1997
- Optical absorbance of oriented thin filmsSynthetic Metals, 1996
- Vacuum-Deposited Thin Film of Linear π-Conjugated Poly(arylene)s. Optical, Electrochemical, and Electrical Properties and Molecular AlignmentThe Journal of Physical Chemistry, 1996
- Polarized electroluminescence from oriented p-sexiphenyl vacuum-deposited filmApplied Physics Letters, 1995
- Crystal structures, phase transitions and energy calculations of poly(p-phenylene) oligomersPolymer, 1993
- Orientation of parasexiphenyl molecules deposited as thin films onto various substratesSynthetic Metals, 1993