Diffusion length measurement and silicon quality

• 30 November 1982
• journal article
• Published by Elsevier in Solar Cells
• Vol. 7  (1-2) , 79-86
• https://doi.org/10.1016/0379-6787(82)90092-8

Abstract

Keywords

• DIFFUSION LENGTH MEASUREMENT
• SILICON QUALITY
• MEASUREMENT AND SILICON