Adhesion and deformation of metal/polyimide layered structures

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Abstract
Adhesion and interfacial failure of Cr, Cu, and Cu/Cr films on a thin pyromellitic dianhydride-oxydianiline polyimide substrate have been investigated using a recently developed stretch deformation technique. This method directly measures the energy required to separate the interface from the difference in the load versus elongation curves between film/substrate and substrate structures. The failure mode was observed in combination with morphological studies by in situ optical microscopy and scanning and transmission electron microscopies. The stress distribution in the sample upon stretching has been computed by a finite element analysis. The difference in the stress relief modes, film fracture, and delamination behavior for Cu versus Cr films is discussed. The important role of crack formation in the metal overlayer for initiating failure is demonstrated. The effects due to the addition of a brittle Cr interface layer between polyimide and Cu on the buildup of stress and the onset of failure have also been investigated.

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