Theory of Critical Behavior in Films

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Abstract
The critical behavior of a thin film which is an intermediate case between a two-dimensional and three-dimensional system is considered and its various modes of critical behavior analyzed. This is used to find scaling-type relations among the two-dimensional and three-dimensional critical indices. We show that a great deal of information on the critical behavior can be obtained from measurements of the thickness dependence of the amplitudes of the various critically diverging quantities.

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