Apparatus for simultaneous measurement of mass change, optical transmittance and reflectance of thin films
- 30 April 1979
- journal article
- Published by Elsevier in Thermochimica Acta
- Vol. 29 (2) , 353
- https://doi.org/10.1016/0040-6031(79)87104-x
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Surface studies with the vacuum microbalanceProgress in Surface Science, 1979
- Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin filmsJournal of Vacuum Science and Technology, 1979