PROTEST: A Tool for Probabilistic Testability Analysis
- 1 January 1985
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 204-211
- https://doi.org/10.1109/dac.1985.1585936
Abstract
The CAD-tool PROTEST (Probabilistic Testability Analysis) is presented. PROTEST estimates for each fault of a combinational circuit its detection probability which can be used as a testability measure. Moreover it calculates the number of random test patterns which must be generated in order to achieve the required fault coverage.It is also demonstrated that the fault coverage will increase and the necessary number of random patterns will drastically decrease, if each primary input is stimulated by test patterns having specific probabilities of being logical “1”. PROTEST uses this fact and determines for each input the optimal signal probability for a randomly generated pattern.Keywords
This publication has 6 references indexed in Scilit:
- STAFAN: An Alternative to Fault SimulationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1984
- Random Pattern TestabilityIEEE Transactions on Computers, 1984
- Fehlererkennung mit Signaturanalyseit - Information Technology, 1983
- An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic CircuitsIEEE Transactions on Computers, 1981
- LSI logic testing — An overviewIEEE Transactions on Computers, 1981
- Probabilistic Analysis of Random Test Generation Method for Irredundant Combinational Logic NetworksIEEE Transactions on Computers, 1975