Damage Introduced by Second Breakdown inN-Channel MOS Devices

• 1 July 1977
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 16  (7) , 1187-1193
• https://doi.org/10.1143/jjap.16.1187

Abstract

Keywords

• POWER DISSIPATION
• IMPACT IONIZATION