X-ray line broadening due to an inhomogeneous dislocation distribution
- 1 April 1998
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 57 (13) , 7535-7542
- https://doi.org/10.1103/physrevb.57.7535
Abstract
A general theory of x-ray line broadening caused by dislocations is presented. It is shown that the leading terms determining the shape of the broadened line profile are independent of the actual dislocation distribution. The intensity distribution can be characterized by average parameters of the dislocation configuration, like the dislocation density, and its fluctuation. For the determination of these parameters a generalized form of Wilson’s variance method is proposed.Keywords
This publication has 14 references indexed in Scilit:
- X-ray Scattering by Dislocations in Crystals. General Theory and Application to Screw DislocationsActa Crystallographica Section A Foundations of Crystallography, 1997
- X-ray diffraction peaks due to misfit dislocations in heteroepitaxial structuresPhysical Review B, 1997
- X-ray diffraction line broadening due to dislocations in non-cubic materials. I. General considerations and the case of elastic isotropy applied to hexagonal crystalsJournal of Applied Crystallography, 1988
- X-ray rocking-curve broadening of tensile-deformed [001]-orientated copper single crystalsPhysica Status Solidi (a), 1987
- X-ray line-broadening study of the dislocation cell structure in deformed [001]-orientated copper single crystalsActa Metallurgica, 1984
- Broadening of X‐ray diffraction lines of crystals containing dislocation distributionsCrystal Research and Technology, 1976
- The determination of density and distribution of dislocations in deformed single crystals from broadened X-ray diffraction profilesPhysica Status Solidi (a), 1970
- Das mittlere Spannungsquadrat 〈σ2〉 begrenzt regellos verteilter Versetzungen in einem zylinderförmigen KörperActa Metallurgica, 1969
- The Separation of Cold-Work Distortion and Particle Size Broadening in X-Ray PatternsJournal of Applied Physics, 1952
- The Effect of Cold-Work Distortion on X-Ray PatternsJournal of Applied Physics, 1950