A model for the field and temperature dependence of Shockley-Read-Hall lifetimes in silicon
- 1 November 1992
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 35 (11) , 1585-1596
- https://doi.org/10.1016/0038-1101(92)90184-e
Abstract
No abstract availableKeywords
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