Reversible temperature dependence of the surface defect structure of nickel oxide at an oxygen pressure of 10−3 Pa studied by X-ray photoelectron spectroscopy
- 31 December 1990
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 50 (1) , 61-66
- https://doi.org/10.1016/0368-2048(90)80007-w
Abstract
No abstract availableKeywords
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