Hydrogen depth profile in sputtered CuxZr1-x amorphous alloys studied by nuclear reaction analysis. Evolution as a function of annealing temperature.
- 31 January 1986
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 57 (1) , 59-61
- https://doi.org/10.1016/0038-1098(86)90670-8
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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