The study of polytypism in silicon carbide by x-ray diffraction topography

• 1 August 1968
• journal article
• Published by Walter de Gruyter GmbH in Zeitschrift für Kristallographie
• Vol. 126  (5-6) , 444-459
• https://doi.org/10.1524/zkri.1968.126.5-6.444

Abstract

Keywords

• X RAY DIFFRACTION