High resolution proton spectroscopy with semiconductor detectors
- 30 November 1967
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 56 (2) , 309-318
- https://doi.org/10.1016/0029-554x(67)90206-6
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Silicon surface barrier detectors; fabrication, test methods, properties and some applicationsNuclear Instruments and Methods, 1966
- Ein rauscharmer ladungsempfindlicher vorverstärker mit feld-effekt-transistorenNuclear Instruments and Methods, 1965
- Pulse formation and transit time of charge carriers in semiconductor junction detectorsNuclear Instruments and Methods, 1964
- The Channelling of Ions through Silicon DetectorsIEEE Transactions on Nuclear Science, 1964
- Ionization Yield of Radiations. II. The Fluctuations of the Number of IonsPhysical Review B, 1947