SEU characterization of hardened CMOS SRAMs using statistical analysis of feedback delay in memory cells
- 1 December 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (6) , 2318-2323
- https://doi.org/10.1109/23.45442
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Suggested Single Event Upset Figure of MeritIEEE Transactions on Nuclear Science, 1983