Progress in the analysis of defect structures with endor spectroscopy

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Abstract
The paper summarizes progress made in analysing defect structures. For this electron spin resonance has long been a standard tool. However, its applicability is often very limited due to its insufficient power to resolve hyperfine structures, necessary to determine defect structures. Nuclear magnetic resonance provides high resolution, but insufficient sensitivity. The combination of both, electron nuclear double resonance (ENDOR), turned out to be the most powerful technique. However, complicated systems with low symmetry or with several types of defects present simultaneously usually yield very complex ENDOR spectra which cannot be analysed using “conventional” methods. Considerable progress was made by improving the experimental methods including computer assistance, processing of the data and novel ENDOR measurement techniques. The application and advantages of methods like ENDOR-induced ESR and DOUBLE ENDOR are demonstrated using several recent examples.

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