Defect-level analysis of semiconductors by a new differential evaluation ofn(1/T)-characteristics
- 1 July 1979
- journal article
- Published by Springer Nature in Applied Physics A
- Vol. 19 (3) , 307-312
- https://doi.org/10.1007/bf00900474
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Cyclotron resonance and cross-modulation with n-type CdTe at 1 mm and 2 mm wavelengthSolid State Communications, 1969
- Elektronische HalbleiterPublished by Springer Nature ,1965
- Cyclotron Resonance in Cadmium TelluridePhysical Review B, 1964
- Electrical Properties of-Type CdTePhysical Review B, 1963