Extent of CdSe presence at ‘formed’ Se–Cd contacts

Abstract
Scanning electron micrographs of cross-sections of Te–Se–Cd sandwich structures have failed to reveal the existence of a CdSe layer at the Se–Cd interface after forming, unless the structures were heated in air at 170°C for 48 hours, in which case a layer about 2 μm thick was observed.

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