In Situ Characterization of Colloidal Spheres by Synchrotron Small-Angle X-ray Scattering
- 1 November 1997
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 13 (23) , 6120-6129
- https://doi.org/10.1021/la970422v
Abstract
No abstract availableThis publication has 39 references indexed in Scilit:
- Transmission and diffraction by photonic colloidal crystalsJournal of Physics: Condensed Matter, 1996
- Small‐angle X‐ray scattering on latexesMacromolecular Chemistry and Physics, 1996
- A Novel Technique for Accurate Intensity Calibration of Area X-ray Detectors at Almost Arbitrary EnergyJournal of Synchrotron Radiation, 1996
- Structural and Thermodynamic Properties of Charged Silica DispersionsThe Journal of Physical Chemistry, 1995
- Detection of nanoscale events in dispersed polymer particles containing a charge‐transfer fluorescence probeJournal of Polymer Science Part A: Polymer Chemistry, 1995
- High-brilliance Beamline at the European Synchrotron Radiation Facilitya)Review of Scientific Instruments, 1995
- Shear Melting of Colloidal Crystals of Charged Spheres Studied with Rheology and Polarizing MicroscopyLangmuir, 1994
- A comparison between the long-time self-diffusion and low shear viscosity of concentrated dispersions of charged colloidal silica spheresThe Journal of Chemical Physics, 1994
- Small-angle neutron scattering from colloidal dispersionsJournal of Applied Crystallography, 1991
- CALIBRATION OF SPHERICAL PARTICLES BY LIGHT SCATTERING USING PHOTON CORRELATION SPECTROSCOPYParticulate Science and Technology, 1989