Structural and electrical defects in amorphous silicon probed by positrons and electrons
- 1 December 1992
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 72 (11) , 5145-5152
- https://doi.org/10.1063/1.351993
Abstract
No abstract availableThis publication has 31 references indexed in Scilit:
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