High front- and back-end resolution MS/MS in Fourier transform ion cyclotron resonance mass spectrometry
- 1 July 1987
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 77 (1) , 95-105
- https://doi.org/10.1016/0168-1176(87)83026-4
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Fourier transform mass spectrometry: Recent instrumental developments and applicationsMass Spectrometry Reviews, 1986
- Fourier transform ion cyclotron resonance mass spectrometryAccounts of Chemical Research, 1985
- External generation of ions in ICR spectrometryInternational Journal of Mass Spectrometry and Ion Processes, 1985
- Ionization and mass analysis of nonvolatile compounds by particle bombardment-quadrupole-Fourier transform mass spectrometryAnalytical Chemistry, 1985
- Developments in analytical fourier-transform mass spectrometryAnalytica Chimica Acta, 1985
- Fourier Transform Mass SpectrometryScience, 1984
- Ion cyclotron resonance spectrometry - a reviewInternational Journal of Mass Spectrometry and Ion Processes, 1984
- Pulsed valve addition of collision and reagent gases in Fourier transform mass spectrometryAnalytical Chemistry, 1983
- Selective-phase Ion Cyclotron Resonance SpectroscopyCanadian Journal of Chemistry, 1974
- Fourier transform ion cyclotron resonance spectroscopyChemical Physics Letters, 1974