The well depths of XeF− and XeCl− from differential scattering measurements
- 1 August 1979
- journal article
- Published by Elsevier in Chemical Physics Letters
- Vol. 65 (1) , 93-94
- https://doi.org/10.1016/0009-2614(79)80134-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The energy curve of XeF, X 2Σ+Chemical Physics Letters, 1976
- Modified statistical method for intermolecular potentials. Combining rules for higher van der Waals coefficientsThe Journal of Chemical Physics, 1974
- Formation of XeCl− in the gas phaseChemical Physics Letters, 1973
- Threshold Electron-Impact Excitation and Negative-Ion Formation in XeF6 and XeF4The Journal of Chemical Physics, 1969