Determination of surface structure and orientation of polymerized tetrafluoroethylene films by near-edge x-ray absorption fine structure, x-ray photoelectron spectroscopy, and static secondary ion mass spectrometry
- 1 February 1993
- journal article
- research article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 9 (2) , 537-542
- https://doi.org/10.1021/la00026a029