Higher-order moments for profiles of statistically rough, real surfaces
- 15 May 1984
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 29 (10) , 5931-5933
- https://doi.org/10.1103/physrevb.29.5931
Abstract
Although for many applications it suffices to have knowledge of only the first two moments of the probability distribution function for profiles of statistically rough surfaces, it is sometimes necessary to specify higher-order moments as well (in particular, to obtain the dispersion relation for surface polaritons on a randomly rough surface). No reports of work related to real surfaces are available in the literature. In this paper we compute higher-order moments for profiles of various statistically rough, real surfaces (metallic and dielectric deposits, and optical polished surfaces). We show that the third moment is approximately zero and that the fourth moment roughly satisfies the standard relation involving the sum of the products of second-order moments taken two-by-two, different in all possible ways.Keywords
This publication has 9 references indexed in Scilit:
- Study of surface roughness for thin films of CaF2 deposited on glass substratesOptics Communications, 1983
- Autocovariance functions for polished optical surfacesJournal of the Optical Society of America, 1983
- Roughness spectrum and surface plasmons for surfaces of silver, copper, gold, and magnesium depositsPhysical Review B, 1983
- Height and slope distributions for surfaces of rough metallic depositsApplied Optics, 1982
- Autocovariance functions, root-mean-square-roughness height, and autocovariance length for rough deposits of copper, silver, and goldPhysical Review B, 1982
- Validity of surface-roughness study using microdensitometer analysis of electron micrographs of surface replicasJournal of the Optical Society of America, 1981
- Study of surface roughness using microdensitometer analysis of electron micrographs of surface replicas II: Autocovariance functionsJournal of the Optical Society of America, 1981
- Study of surface roughness using a microdensitometer analysis of electron micrographs of surface replicas: I Surface profilesJournal of the Optical Society of America, 1981
- Study of surface plasma-wave reflectance and roughness-induced scattering in silver foilsPhysical Review B, 1980