Detector Background And Sensitivity Of Semiconductor X-Ray Fluorescence Spectrometers
- 1 January 1971
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 15, 470-482
- https://doi.org/10.1154/s0376030800011137
Abstract
Degraded detector pulses are shown to contribute most of the background in spectra produced by semiconductor-detector X-ray spectrometers. A new guard-ring detector is used with appropriate circuits to reduce background by a large factor. We discuss the sensitivity of the new arrangement with various excitation sources.Keywords
This publication has 2 references indexed in Scilit:
- Semiconductor Radiation DetectorsScience, 1970
- Geometric Control of Surface Leakage Current and Noise in Lithium Drifted Silicon Radiation DetectorsIEEE Transactions on Nuclear Science, 1966