Physical mechanisms in double-carrier trap-charge limited transport processes in organic electroluminescent devices: A numerical study
- 28 May 1998
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 83 (12) , 7706-7714
- https://doi.org/10.1063/1.367942
Abstract
We have developed a numerical model to simulate the double-carrier injection trap-charge limited (TCL) transport processes in organic electroluminescent devices (OEDs). Current–voltage characteristics, energy and charge profiles are obtained and analyzed to understand the mechanisms governing the OED performance under TCL conditions. Good agreement with general experimental trends and previous analytical predictions are achieved. Dependencies on several important parameters (carrier injection level, device thickness, recombination constant, temperature, etc.) are also studied.This publication has 23 references indexed in Scilit:
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