Calculation of the ellipsometric parameters characterizing a randomly rough surface by means of the Stratton-Chu-Silver integral
- 31 January 1973
- journal article
- Published by Elsevier in Optics Communications
- Vol. 7 (1) , 76-79
- https://doi.org/10.1016/0030-4018(73)90115-6
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Ellipsometric parameters of randomly rough surfacesOptics Communications, 1972
- Polarization Characteristics of Scattered Radiation from a Diffraction Grating by Ellipsometry with Application to Surface RoughnessPhysical Review B, 1972
- Bidirectional Scattering of Electromagnetic Waves from Rough SurfacesJournal of Applied Physics, 1971
- Theory of cross polarized power returned from a random surfaceFlow, Turbulence and Combustion, 1968
- Relation between the Height Distribution of a Rough Surface and the Reflectance at Normal IncidenceJournal of the Optical Society of America, 1963