IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE
- 15 July 1969
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 15 (2) , 58-59
- https://doi.org/10.1063/1.1652901
Abstract
The appearance of phase‐contrast, Fresnel fringes and various forms of diffraction contrast in images produced by transmission scanning electron microscopes can be understood simply by invoking the principle of reciprocity to equate the imaging conditions to those relevant to a conventional electron microscope.Keywords
This publication has 3 references indexed in Scilit:
- A High-Resolution Scanning Transmission Electron MicroscopeJournal of Applied Physics, 1968
- A test object and criteria for high resolution electron microscopyJournal of Applied Crystallography, 1968
- Reciprocity in electron diffraction and microscopyActa Crystallographica Section A, 1968