Method for calibrating the analyser and the polarizer in an ellipsometer
- 1 October 1969
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 2 (10) , 1483-1485
- https://doi.org/10.1088/0022-3727/2/10/420
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963