Computational techniques in the analysis of dielectric relaxation measurements
- 31 October 1972
- journal article
- review article
- Published by Elsevier in Advances in Molecular Relaxation Processes
- Vol. 4 (2) , 159-191
- https://doi.org/10.1016/0001-8716(72)80012-9
Abstract
No abstract availableThis publication has 49 references indexed in Scilit:
- Reflection spectroscopyPhysics Bulletin, 1971
- Wide-frequency-range dielecteric spectrometerProceedings of the Institution of Electrical Engineers, 1970
- The determination of refractive index spectra by fourier spectrometryInfrared Physics, 1969
- Measurement of dielectrics in the time domainThe Journal of Physical Chemistry, 1969
- Measurement of the far infrared optical properties of solids with a michelson interferometer used in the asymmetric mode: Part I, mathematical formulation∗Infrared Physics, 1966
- The low frequency dielectric relaxation of polyoxymethylene (Delrin) using a direct current techniquePolymer, 1963
- Optical Constants from Reflectance Ratios by a Geometric Construction*Journal of the Optical Society of America, 1963
- Evaluation of dielectric loss data from direct current measurementsTransactions of the Faraday Society, 1962
- Effect of Deuteration on Dielectric Relaxation inn‐PropanolThe Journal of Chemical Physics, 1959
- A Transient Method for Measurement of Dielectric PolarizationReview of Scientific Instruments, 1951