Concerning the Reliability of Electron Tubes
- 1 October 1952
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IRE
- Vol. 40 (10) , 1204-1206
- https://doi.org/10.1109/jrproc.1952.274090
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Statistical Evaluation of Life Expectancy of Vacuum Tubes Designed for Long-Life OperationProceedings of the IRE, 1951