Paradigms of quality for microelectronics and SMT

• 1 January 1991
• journal article
• Published by Elsevier in Microelectronics Reliability
• Vol. 31  (6) , 1119-1122
• https://doi.org/10.1016/0026-2714(91)90300-v

Abstract

Keywords

• PARADIGMS OF QUALITY FOR MICROELECTRONICS
• QUALITY FOR MICROELECTRONICS AND SMT