Failure distributions of shock models
- 1 March 1980
- journal article
- research article
- Published by Cambridge University Press (CUP) in Journal of Applied Probability
- Vol. 17 (03) , 745-752
- https://doi.org/10.1017/s0021900200033854
Abstract
A single device shock model is studied. The device is subject to some damage process. Under the assumption that as the cumulative damage increases, the probability that any additional damage will cause failure increases, we find sufficient conditions on the shocking process so that the life distribution will be increasing failure rate.Keywords
This publication has 4 references indexed in Scilit:
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- Shock Models and Wear ProcessesThe Annals of Probability, 1973
- Some Stochastic Properties of a Compound-Renewal Damage ModelOperations Research, 1966
- Total positivity, absorption probabilities and applicationsTransactions of the American Mathematical Society, 1964